smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Model Family: SAMSUNG SpinPoint P80 SD series Device Model: SAMSUNG HD160JJ Serial Number: S08HJ1MA108502 Firmware Version: ZM100-33 User Capacity: 160,040,803,840 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a Local Time is: Sun Dec 14 15:57:47 2008 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (3677) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 61) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 6080 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 97 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 18817 10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 253 002 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 87 190 Airflow_Temperature_Cel 0x0022 130 091 000 Old_age Always - 36 194 Temperature_Celsius 0x0022 130 091 000 Old_age Always - 36 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 23689582 196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 2 200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0 202 TA_Increase_Count 0x0032 253 253 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 18604 hours (775 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 08 79 dc d8 e7 Error: ICRC, ABRT 8 sectors at LBA = 0x07d8dc79 = 131652729 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 79 dc d8 e7 00 25d+02:30:42.125 READ DMA c8 00 08 71 dc d8 e7 00 25d+02:30:42.125 READ DMA c8 00 08 69 dc d8 e7 00 25d+02:30:42.125 READ DMA c8 00 08 59 dc d8 e7 00 25d+02:30:42.125 READ DMA c8 00 08 51 dc d8 e7 00 25d+02:30:42.125 READ DMA Error 1 occurred at disk power-on lifetime: 18604 hours (775 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 49 0d e0 e7 Error: ICRC, ABRT at LBA = 0x07e00d49 = 132123977 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 00 49 0d e0 e7 00 25d+02:30:41.938 READ DMA c8 00 80 39 0c e0 e7 00 25d+02:30:41.938 READ DMA c8 00 80 b9 0b e0 e7 00 25d+02:30:41.938 READ DMA c8 00 68 91 13 e0 e7 00 25d+02:30:41.938 READ DMA c8 00 40 d1 0a e0 e7 00 25d+02:30:41.938 READ DMA SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.